Title :
Formal testing applied in embedded software
Author :
Li, Zhen ; Liu, Bin ; Ma, Ning ; Yin, Yongfeng
Author_Institution :
Dept. of Syst. Eng., Beihang Univ., Beijing, China
Abstract :
Embedded systems have the features of being driven by events, concurrency, high safety, high reliability and so on. Considering the system states transference, real-time concurrence and schedule strategies, it is necessary and suitable to use formal methods to software testing. This paper laid out the induction of the dependable attributes of embedded software and focused on the modeling and validation on models in a formal view. Meanwhile, we put forward an integrated framework to test embedded software with formal validation and automated test cases generation. Using this framework and according to the collected failure mode base, we can improve the efficiency of testing by generating corresponding and various test cases automatically. In the end the framework was proven to be practical with an example, which expanded the formal description of state charts and generated test cases on interface automatically.
Keywords :
Petri nets; Unified Modeling Language; concurrency control; embedded systems; formal specification; program testing; program verification; scheduling; software fault tolerance; Petri net; UML state chart; automated test case generation; concurrency feature; embedded system; event-driven feature; failure mode base; formal description; formal software testing method; formal validation; integrated embedded software test framework; model checking; real-time concurrency strategy; reliability feature; safety feature; scheduling strategy; system state transference; Automatic testing; Circuit testing; Concurrent computing; Embedded software; Logic; Object oriented modeling; Software testing; System testing; Systems engineering and theory; Unified modeling language; failure mode; formal; model checking; software testing; test case;
Conference_Titel :
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4903-3
Electronic_ISBN :
978-1-4244-4905-7
DOI :
10.1109/ICRMS.2009.5270098