Title :
Software BIT design and testing for embedded software
Author :
Wang, Yichen ; Zhou, Zhenzhen
Author_Institution :
Dept. of Syst. Eng., Beihang Univ., Beijing, China
Abstract :
Build-in-test of software is designed in embedded system widely. This paper analyses the general architecture of the embedded system, introduces three types of BIT structure pattern, for each pattern, the arithmetic design is described in details with real practice. This paper presents a new s/w BIT approach based on fault injection. Four important phrases: testing requirement analysis, fault injection, testing design and result analysis are described thoroughly in this approach. The ending part is the summery of the paper.
Keywords :
built-in self test; embedded systems; program testing; BIT structure pattern; arithmetic design; build-in-test; embedded software testing; embedded system; fault injection; software BIT design; testing requirement analysis; Application software; Built-in self-test; Embedded software; Embedded system; Hardware; Pattern analysis; Software algorithms; Software design; Software testing; System testing; embedded software; fault injection; software Build-In-Test; software testability; software testing;
Conference_Titel :
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4903-3
Electronic_ISBN :
978-1-4244-4905-7
DOI :
10.1109/ICRMS.2009.5270099
