Title :
Temperature dependency and dielectric properties of EPDM with void
Author :
Kim, Dong-Shick ; Kang, Moo-Seong ; Oh, Jae-Hyung ; Lee, Chang-Hun ; Park, Dae-Hee ; Kim, Yong- Joo
Author_Institution :
Sch. of Electr. Eng., Wonkwang Univ., Iksan, Japan
Abstract :
The dielectric characteristics of EPDM were characterized and the temperature dependency was also evaluated at the constant electric field. While the value of tan δ was 3.55×10-3(%) and increased with increasing temperature in EPDM without voids, the value of tan δ was lowered to 2.24×10-3(%) and the temperature influence on tan δ was not shown to be great in the EPDM containing voids. It was shown that the dielectric properties of EPDM was the most influencing factor on the properties of EPDM/semiconductor specimen but the semiconductor layer played only a simple role as an electrode in the specimen
Keywords :
dielectric losses; ethylene-propylene rubber; voids (solid); EPDM; dielectric properties; loss angle; semiconductor layer electrode; temperature dependence; void; Aging; Cable insulation; Capacitance; Dielectrics and electrical insulation; Electrodes; Paramagnetic resonance; Rubber; Temperature dependence; Temperature distribution; Voltage;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-2651-2
DOI :
10.1109/ICPADM.1997.616606
