Title :
Frequency blueshift during laser-induced breakdown of dielectrics
Author :
Gupta, D.N. ; Viswakarma, N.
Author_Institution :
Dept. of Phys., Indian Inst. of Technol., New Delhi, India
Abstract :
Summary form only given. A phenomenological model of frequency blueshift during laser breakdown of dielectrics by ultra-fast pulses is developed. The time scale is too short for heat conduction and diffusion consequently interaction is spatially localized. Laser causes electron-hole pair production via tunneling of valence electrons to conduction band, Joule heating and avalanche production of electron-hole pairs, via collisions. As the free carrier density rises, refractive index decreases, modulating the phase of the laser and causing frequency blueshift.
Keywords :
avalanche breakdown; carrier density; conduction bands; dielectric materials; diffusion; electron-hole recombination; heat conduction; laser beam effects; phase modulation; refractive index; spectral line shift; tunnelling; valence bands; Joule heating; avalanche production; collision; conduction band; dielectrics; diffusion; electron-hole pair production; free carrier density; frequency blueshift; heat conduction; laser breakdown; phase modulation; refractive index; tunneling; ultrafast pulse; valence electron; Charge carrier density; Dielectric breakdown; Electrons; Frequency; Heating; Laser modes; Optical pulses; Production; Refractive index; Tunneling;
Conference_Titel :
Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-8334-6
DOI :
10.1109/PLASMA.2004.1340268
