Frequency blueshift during laser-induced breakdown of dielectrics

Author

Gupta, D.N. ; Viswakarma, N.

Author_Institution

Dept. of Phys., Indian Inst. of Technol., New Delhi, India

fYear

2004

fDate

1-1 July 2004

Firstpage

449

Abstract

Summary form only given. A phenomenological model of frequency blueshift during laser breakdown of dielectrics by ultra-fast pulses is developed. The time scale is too short for heat conduction and diffusion consequently interaction is spatially localized. Laser causes electron-hole pair production via tunneling of valence electrons to conduction band, Joule heating and avalanche production of electron-hole pairs, via collisions. As the free carrier density rises, refractive index decreases, modulating the phase of the laser and causing frequency blueshift.

Keywords

avalanche breakdown; carrier density; conduction bands; dielectric materials; diffusion; electron-hole recombination; heat conduction; laser beam effects; phase modulation; refractive index; spectral line shift; tunnelling; valence bands; Joule heating; avalanche production; collision; conduction band; dielectrics; diffusion; electron-hole pair production; free carrier density; frequency blueshift; heat conduction; laser breakdown; phase modulation; refractive index; tunneling; ultrafast pulse; valence electron; Charge carrier density; Dielectric breakdown; Electrons; Frequency; Heating; Laser modes; Optical pulses; Production; Refractive index; Tunneling;

fLanguage

English

Publisher

ieee

Conference_Titel

Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on

Conference_Location

Baltimore, MD, USA

ISSN

0730-9244

Print_ISBN

0-7803-8334-6

Type

conf

DOI

10.1109/PLASMA.2004.1340268

Filename

1340268