Title :
Characterization of pulse induced plasma fueled by aluminum metallization
Author :
Buneo, J.D. ; Zirnheld, J.L. ; Burke, K.M. ; Sarjeant, W.J. ; Sussman, M. ; Freund, C.
Author_Institution :
Energy Syst. Inst., Univ. at Buffalo, NY, USA
Abstract :
Summary form only given. Plasmas induced by contaminated surface flashover of insulators can produce serious detrimental effects to the energy systems that incur them. Studies at the Energy Systems Institute (ESI) at the University at Buffalo and the Advanced Energy Armaments Systems Center (AEAS) of U.S. Army ARDEC have been focusing on flashover of thin metallized films for use in low energy light sources. The film under test is capacitor grade metallized polypropylene film cut to dimensions of 12"/spl times/ 3/4 ". Flashover is initiated via a 2 /spl mu/F capacitor charged to 2500 V dc and that is then discharged directly through the film via stainless steel electrodes. Characterization of the flashover is performed through current and voltage probes and photodiodes. Three photodiodes were used to measure the spectral intensity of the thin film flashover. These intensities are in the spectrum of far red, infrared, and visible light. These preliminary investigations will aid in the further development of low energy light sources.
Keywords :
aluminium; capacitors; electrodes; flashover; infrared spectra; metallic thin films; metallisation; photodiodes; plasma probes; polymer films; visible spectra; 2 muF; 2500 V; Al; aluminum metallization; capacitor grade metallized polypropylene film; contaminated surface flashover; infrared spectra; light source; photodiode; plasma probe; pulse induced plasma; spectral intensity; stainless steel electrode; thin film flashover; thin metallized film; visible light spectra; Aluminum; Capacitors; Flashover; Insulation; Light sources; Metallization; Photodiodes; Plasmas; Surface contamination; Testing;
Conference_Titel :
Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-8334-6
DOI :
10.1109/PLASMA.2004.1340272