Title :
Recent developments on Weibull statistics
Author_Institution :
KEMA, Arnhem, Netherlands
Abstract :
The paper describes a selection of matters that have been discussed during recent years: parameter estimation and plotting. The paper discusses the relevance of applying corrections and countermeasures by evaluating the effects that occur with usual inferences. It is recommended, for cases with small test sample sets, to apply the available correction techniques
Keywords :
Weibull distribution; parameter estimation; statistical analysis; Weibull statistics; correction techniques; countermeasures; parameter estimation; plotting; test sample sets; Bars; Electric breakdown; Parameter estimation; Production; Quality control; Reliability; Scattering parameters; Statistics; System testing; Yield estimation;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-2651-2
DOI :
10.1109/ICPADM.1997.616607
