DocumentCode
3513122
Title
Recent developments on Weibull statistics
Author
Ross, Robert
Author_Institution
KEMA, Arnhem, Netherlands
Volume
2
fYear
1997
fDate
25 -30 May 1997
Firstpage
976
Abstract
The paper describes a selection of matters that have been discussed during recent years: parameter estimation and plotting. The paper discusses the relevance of applying corrections and countermeasures by evaluating the effects that occur with usual inferences. It is recommended, for cases with small test sample sets, to apply the available correction techniques
Keywords
Weibull distribution; parameter estimation; statistical analysis; Weibull statistics; correction techniques; countermeasures; parameter estimation; plotting; test sample sets; Bars; Electric breakdown; Parameter estimation; Production; Quality control; Reliability; Scattering parameters; Statistics; System testing; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location
Seoul
Print_ISBN
0-7803-2651-2
Type
conf
DOI
10.1109/ICPADM.1997.616607
Filename
616607
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