DocumentCode
3513139
Title
Improvement on Masking and Flagging Technique on Reducing SST Residual
Author
Ng, H.G. ; MatJafri, M.Z. ; Abdullah, K. ; Wong, C.J.
Author_Institution
Sch. of Phys., Univ. Sains Malaysia, Penang
fYear
2008
fDate
1-8 March 2008
Firstpage
1
Lastpage
9
Abstract
Sea surface temperature (SST) retrieval depends greatly on algorithm coefficient estimation. However, the algorithm coefficient estimation is relevant to pixel data chosen for multiple regressions analysis. Therefore the proper masking and flagging procedures will ensure that only the good pixels are only chosen for algorithm coefficient analysis. In this paper, new techniques of masking and flagging test were studied. The techniques were based on the characteristics of sea surface temperature at equatorial regions. Statistical techniques included digital satellite data sampling, normality, symmetrical, and homogeneity tests on small-scale and large-scale extraction of group pixels. The SST algorithm was calibrated by correlating in-situ SST data with thermal bands brightness temperatures and sensor zenith angle. In-situ SST data was acquired by drift buoy data, Research on the SEa and islands of Malaysia (ROSES) project and moored buoy data, Malaysia Meteorology Departments. The validation of algorithm with in-situ data showed that combination of of conventional techniques and improved techniques reduced the SST residuals and increase the correlations coefficients.
Keywords
ocean temperature; oceanographic techniques; regression analysis; Malaysia; SST residual reduction; South China Sea; algorithm coefficient estimation; digital satellite data sampling; drift buoy data; equatorial regions; flagging technique; masking improvement; multiple regressions analysis; sea surface temperature retrieval; sensor zenith angle; statistical techniques; thermal bands brightness temperatures; Algorithm design and analysis; Large-scale systems; Ocean temperature; Regression analysis; Sampling methods; Satellites; Sea surface; Temperature dependence; Temperature sensors; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference, 2008 IEEE
Conference_Location
Big Sky, MT
ISSN
1095-323X
Print_ISBN
978-1-4244-1487-1
Electronic_ISBN
1095-323X
Type
conf
DOI
10.1109/AERO.2008.4526396
Filename
4526396
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