• DocumentCode
    3513181
  • Title

    Effect of humidity on SAW devices

  • Author

    Anisimkin, V.I. ; Maximov, S.A. ; Verardi, P. ; Verona, E.

  • Author_Institution
    Inst. of Radio Eng. & Electron., Acad. of Sci., Moscow, Russia
  • Volume
    1
  • fYear
    1997
  • fDate
    5-8 Oct 1997
  • Firstpage
    409
  • Abstract
    Adsorption of water vapors on single crystal and polycrystalline substrates is analyzed using the propagation of surface acoustic waves as an experimental tool. The perturbation in the SAW velocity (Δv/v0), the number N of adsorbed species as well as the changes in the density Δρ/ρ and in the elastic moduli Δcij/cij of the sorbent materials, are deduced in terms of the normalized SAW displacements Ax, A y, Az and of the unperturbed SAW velocity v0 . Vapour adsorption on polished plates of single crystal quartz and polycrystalline films of Pd and Pd:Ni is experimentally investigated. Results of the measurements clearly show that humidity adsorption gives rise to effects whose amplitude is larger and whose time duration is longer in the films than in the plates. These effects are also dependent on the orientation of the quartz, allowing to monitor the value and the rate of the effect by proper selection of a substrate material
  • Keywords
    adsorption; humidity sensors; nickel; palladium; quartz; substrates; surface acoustic wave devices; surface acoustic wave filters; surface acoustic wave resonators; surface acoustic wave sensors; surface acoustic waves; H2O; Pd; Pd:Ni; SAW devices; SAW filters; SAW humidity sensor; SAW propagation; SAW resonators; SAW velocity; adsorption of water vapor; density changes; elastic moduli changes; humidity effect; normalized SAW displacements; number of adsorbed species; orientation effect; polished plates; polycrystalline films; polycrystalline substrates; single crystal quartz; single crystal substrates; Acoustic materials; Acoustic propagation; Acoustic waves; Crystallization; Humidity; Substrates; Surface acoustic wave devices; Surface acoustic waves; Thin film devices; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-4153-8
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1997.663050
  • Filename
    663050