• DocumentCode
    3513343
  • Title

    Analytical techniques used to determine chemical degradation of polymeric materials used in PV modules after sustained exposure to partial discharge voltages

  • Author

    Phillips, Nancy H. ; Givot, B. ; O´Brien, Bill ; Korba, G. ; Loyd, Jaylon

  • Author_Institution
    3M Co., St. Paul, MN, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    Partial Discharge is one of a number of tests defined in IEC61730-2, which specifies properties of photovoltaic modules and components to assure safe electrical operation during their expected lifetimes. From the perspective of backsheet/ frontsheet designers and developers, the test is of practical importance because of the criteria it places on material choice and film thickness. Our objective is to study the chemistry of electrically induced degradation of PV front/backsheet materials, in order to improve the linkage of the partial discharge test with electrical safety. We have used ESCA to determine extent of chemical degradation of several polymeric films after exposure to voltage greater than Vi for 24 hours; we´ve shown that degradation occurs in the annulus of the electrode, presumably at the distance given by the Paschen´s law minimum. The relative rates of degradation in decreasing order are polypropylene >; PET >; THV, with no measurable degradation to the THV film.
  • Keywords
    electrochemical electrodes; partial discharges; solar cells; IEC61730-2; PV front-backsheet materials; PV modules; Paschen´s law; THV film; analytical techniques; chemical degradation; electrically induced degradation; electrode; film thickness; partial discharge voltages; photovoltaic cells; photovoltaic modules; polymeric materials; Films; Indexes; Photovoltaic systems; Polymers; Positron emission tomography; Voltage measurement; backsheets; dielectric films; partial discharge; photovoltaic cells; polymeric films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6317613
  • Filename
    6317613