Electronic process limited yield

Author

Maier, Gary W. ; Smith, Shawn

Author_Institution

Power PC Product Eng., IBM Corp., USA

fYear

2000

fDate

2000

Firstpage

467

Lastpage

473

Abstract

Today´s industry is expanding the high performance microprocessor market into the consumer market place. This market requires very low cost, high reliability, stricter SPQL levels, and very high yields. A New Diagnostic Methodology is required to meet these new demands. This paper addresses a broad scope of issues from Product Design and Manufacturing Test, to Diagnostic and Data Analysis Tools. It describes a beta test case currently in operation on IBM´s latest PowerPC products in their copper and SOI technologies

Keywords

consumer electronics; fault diagnosis; integrated circuit reliability; integrated circuit testing; integrated circuit yield; microprocessor chips; production testing; PowerPC products; SOI technologies; SPQL levels; beta test case; consumer market; data analysis tools; diagnostic methodology; high performance microprocessor market; manufacturing test; process limited yield; product design; reliability; Algorithms; Built-in self-test; Clocks; Condition monitoring; Design engineering; Electronic equipment testing; Manufacturing processes; Pattern matching; Power engineering and energy; Product design;

fLanguage

English

Publisher

ieee

Conference_Titel

Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on

Conference_Location

San Jose, CA

Print_ISBN

0-7695-0525-2

Type

conf

DOI

10.1109/ISQED.2000.838924

Filename

838924