DocumentCode :
3513565
Title :
Contrast enhancement of luminescence images via point-spread deconvolution
Author :
Walter, Daniel ; Liu, Anyao ; Franklin, Evan ; Macdonald, Daniel ; Mitchell, Bernhard ; Trupke, Thorsten
Author_Institution :
Centre for Sustainable Energy Syst., Australian Nat. Univ., Canberra, ACT, Australia
fYear :
2012
fDate :
3-8 June 2012
Abstract :
We investigate the impact of point-spread in the silicon CCD sensor of a BT Imaging LIS-R1 luminescence imaging system. It is found that an experimental definition of the point-spread function allows for a significant restoration of CCD point-spread to be achieved. A comparison with short-pass filtering is performed, demonstrating that point-spread will still have a measurable influence on image quality while reducing the luminescence signal and increasing the relative noise level. An implementation of point-spread deconvolution is presented at a multi-crystalline silicon grain boundary, illustrating a practical enhancement of resolution in a typical high-contrast scenario. The characteristics of the point-spread presented here are specific to the experimental apparatus investigated, but the procedure described is universally applicable.
Keywords :
CCD image sensors; deconvolution; elemental semiconductors; grain boundaries; optical filters; optical transfer function; photoluminescence; silicon; BT imaging; LIS-R1 luminescence imaging system; Si; image quality; multicrystalline silicon grain boundary; photoluminescence; point-spread deconvolution function; relative noise level; short-pass filtering; silicon CCD sensor; Charge coupled devices; Deconvolution; Filtering; Imaging; Luminescence; Photonics; Silicon; deconvolution; luminescence imaging; point-spread function;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6317624
Filename :
6317624
Link To Document :
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