DocumentCode :
3513791
Title :
Image Quality Measures for Predicting Automatic Target Recognition Performance
Author :
Chen, Yin ; Chen, Genshe ; Blum, Rick S. ; Blas, Erik ; Lynch, Robert S.
Author_Institution :
Intell. Autom. Inc., Rockville, MD
fYear :
2008
fDate :
1-8 March 2008
Firstpage :
1
Lastpage :
9
Abstract :
One important issue for Automatic Target Recognition (ATR) systems is to learn how robust the performance is under different scenarios. The quality of the input image sequence is a major factor affecting the ATR algorithm´s ability to detect and recognize an object. If one can correlate the algorithm performance with different image quality measures, the recognition confidence can be predicted before applying ATR by predetermining the input image quality. In this paper, we address the utility of image quality measures and their correlations with performance failures of a principle component analysis (PCA) based ATR algorithm. Various image fusion approaches are examined to illustrate their abilities to improve ATR performance. Results show that the Shift Invariant Discrete Wavelet Transform (SiDWT) and Laplacian pyramid fusion schemes outperform other methods for improving the detection rate with the considered SAR images. Regression analysis is conducted to show that linear combinations of the selected image quality measures could explain about 60% of the variability in the non-detections of the ATR algorithm.
Keywords :
image fusion; image sequences; military systems; object recognition; principal component analysis; radar target recognition; regression analysis; target tracking; automatic target recognition performance; image fusion; image quality measures; input image sequence; principle component analysis; regression analysis; Discrete wavelet transforms; Failure analysis; Image analysis; Image quality; Image recognition; Image sequences; Object detection; Performance analysis; Robustness; Target recognition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace Conference, 2008 IEEE
Conference_Location :
Big Sky, MT
ISSN :
1095-323X
Print_ISBN :
978-1-4244-1487-1
Electronic_ISBN :
1095-323X
Type :
conf
DOI :
10.1109/AERO.2008.4526432
Filename :
4526432
Link To Document :
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