Title : 
Study of reliability integrated assessment method based on performance, environmental and reliability tests for electronic products
         
        
            Author : 
Wan, Bo ; Zhuang, Xiaotiang
         
        
            Author_Institution : 
Dept. of Syst. Eng., Beihang Univ., Beijing, China
         
        
        
        
        
        
            Abstract : 
The paper constructs the multi-regress-analysis reliability assessment method based on the exponential regression model due to the possible fewer samples for testing in electronic products reliability assessment. By introducing environmental severe degree factors, environmental integrated factors and technique states of the product factors, the multi-regress-analysis reliability assessment method is established and product reliability assessment is implemented based on performance test data, environmental test data, and reliability test data. When using this method, the time data does not need to be converted under different environment, and the regression parameters will be calculated to give the pertinent reliability parameters, which is quite different from the classic environmental-changing and maternal-changing reliability integrated assessment method.
         
        
            Keywords : 
electronic equipment testing; electronic products; environmental testing; equipment evaluation; regression analysis; reliability; environmental changing reliability; environmental reliability test; exponential regression model; maternal changing reliability; multiregress analysis reliability assessment method; performance reliability test; product reliability assessment; reliability integrated assessment method; Data engineering; Electronic equipment testing; Electronic mail; Environmental factors; Hazards; Product development; Reliability engineering; Stress; System testing; Systems engineering and theory; exponential regression model; integrated assessment; reliability;
         
        
        
        
            Conference_Titel : 
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
         
        
            Conference_Location : 
Chengdu
         
        
            Print_ISBN : 
978-1-4244-4903-3
         
        
            Electronic_ISBN : 
978-1-4244-4905-7
         
        
        
            DOI : 
10.1109/ICRMS.2009.5270155