DocumentCode :
3513872
Title :
Large-grain polysilicon seed layers on glass for epitaxial silicon solar cells
Author :
Shumate, S.D. ; Mohammed, Hazem ; Hutchings, Douglas A. ; Naseem, Hameed A.
Author_Institution :
Microelectron.-Photonics, Univ. of Arkansas, Fayetteville, AR, USA
fYear :
2012
fDate :
3-8 June 2012
Abstract :
Thin-film silicon solar cells remain a promising technology to approach wafer-based efficiencies at thin-film costs. Epitaxial growth of silicon cells on seed layers has been a prominent approach with demonstrated efficiencies. However, cost-effective seed layers on glass or other low-cost substrates still remain one of the biggest road blocks to the success of this technology. Top-down aluminum induced crystallization (TAIC) has been developed to produce large-grain silicon seed layers on glass. Initial cells have been fabricated by Hot-Wire CVD at the National Renewable Energy Laboratory (NREL). The seed layers with grain-gaps show poor electrical characteristics comparable to reported cells grown on wafer templates with defect densities around 2 × 106 cm-3. New seed layers without grain gaps have been developed and are in queue for cell fabrication.
Keywords :
aluminium; chemical vapour deposition; crystallisation; elemental semiconductors; epitaxial growth; glass; semiconductor epitaxial layers; semiconductor growth; silicon; solar cells; Al; NREL; National Renewable Energy Laboratory; Si; TAIC; cell fabrication; cost-effective seed layers; defect density; epitaxial silicon solar cells; glass; hot-wire CVD; large-grain polysilicon seed layers; silicon cell epitaxial growth; thin-film silicon solar cells; top-down aluminum induced crystallization; wafer templates; wafer-based efficiency; Abstracts; Epitaxial growth; Glass; Image edge detection; Indexes; Silicon; Wires; HOT WIRE CVD; INSULATOR; POLYSILICON; THIN-FILM SILICON;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6317639
Filename :
6317639
Link To Document :
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