DocumentCode
3513887
Title
Robust Bayesian tracking on Riemannian manifolds via fragments-based representation
Author
Wu, Yi ; Wang, Jinqiao ; Lu, Hanqing
Author_Institution
Inst. of Autom., Chinese Acad. of Sci., Beijing
fYear
2009
fDate
19-24 April 2009
Firstpage
765
Lastpage
768
Abstract
Recently, the covariance region descriptor has been proved robust and versatile for a modest computational cost. It enables efficient fusion of different types of features. Based on the covariance descriptor and the metric on Riemannian manifolds, we develop a robust Bayesian tracking framework via fragments-based representation in this paper. In this framework, the template object is represented by multiple image fragments or patches. Every patch votes on the possible state of the object in the current frame, by comparing its covariance descriptor with the corresponding image patch model. Tracking is then led by the Bayesian state inference framework in which a particle filter is used for propagating sample distributions over time. The weight of each particle is formulated by combining the votes of the patches using a robust statistic. Further, we extend the fast covariance computation to the Bayesian tracking problem, which makes the tracking procedure more efficient. We present extensive experimental results on challenging sequences, which demonstrate the robust tracking achieved by our algorithm.
Keywords
Bayes methods; covariance analysis; image representation; particle filtering (numerical methods); tracking; Bayesian tracking; Riemannian manifolds; covariance region descriptor; fragments-based representation; multiple image fragments; particle filter; Bayesian methods; Computational efficiency; Covariance matrix; Feature extraction; Histograms; Particle filters; Particle tracking; Robustness; Target tracking; Voting; Bayesian tracking; Particle filter; Riemannian manifolds; covariance descriptor; integral image;
fLanguage
English
Publisher
ieee
Conference_Titel
Acoustics, Speech and Signal Processing, 2009. ICASSP 2009. IEEE International Conference on
Conference_Location
Taipei
ISSN
1520-6149
Print_ISBN
978-1-4244-2353-8
Electronic_ISBN
1520-6149
Type
conf
DOI
10.1109/ICASSP.2009.4959696
Filename
4959696
Link To Document