DocumentCode :
3513889
Title :
Evaluation model for products´ expected life based on performance degradation amplitude anlysis
Author :
Su, Chun ; Jiang, Youhai
Author_Institution :
Sch. of Mech. Eng., Southeast Univ., Nanjing, China
fYear :
2009
fDate :
20-24 July 2009
Firstpage :
425
Lastpage :
428
Abstract :
Traditional life evaluation theory established on the basis of mass failure data, the phenomena of little or naught failure put forward challenges for existing life evaluation theory. The performance degradation data provides useful information for products´ life and reliability, and gives feasible way for life evaluation. The limitations of existing stochastic process models for performance degradation are analyzed; a new approach based on performance degradation amplitude is brought forward, the calculation methods based on degradation amplitude analysis are given out. For degradation product with large amplitude size, by way of fitting the reliability of every moments, the performance degradation rule can be got and the products´ life can be forecast; for small amplitude size, the degradation path is selected in accordance to engineering experience and products´ failure mechanism, the products´ expected life and reliability is evaluated based on appropriate distribution model. An example of laser device with performance degradation data is given out to validate the effectiveness of the method.
Keywords :
product life cycle management; reliability; stochastic processes; mass failure data; performance degradation amplitude analysis; product expected life evaluation model; product reliability; stochastic process; Degradation; Electronic mail; Failure analysis; Laser modes; Mechanical engineering; Performance analysis; Predictive models; Reliability engineering; Stochastic processes; Sun; degradation amplitude; degradation path; life evaluation; performance degradation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4903-3
Electronic_ISBN :
978-1-4244-4905-7
Type :
conf
DOI :
10.1109/ICRMS.2009.5270156
Filename :
5270156
Link To Document :
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