Title :
αRAM: An α particle detecting MOS IC for radon monitoring
Author :
Griffin, R.H. ; Le, H. ; Jack, D.T. ; Tarr, N.G.
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, ON
Abstract :
A custom integrated circuit (ldquoalphaRAMrdquo) capable of detecting the alpha particles emitted in the decay of radon and its progeny has been designed, fabricated and successfully tested. The alphaRAM has been incorporated in a complete radon monitor using electrostatic concentration of radon progeny. The monitor can detect hazardous levels of radon within hours.
Keywords :
MOS integrated circuits; application specific integrated circuits; particle detectors; radioactive decay periods; radon; MOS integrated circuit; Rn; alpha particle detection; alphaRAM; custom integrated circuit; electrostatic concentration; radon decay; radon monitoring; radon progeny; Circuit testing; Detectors; Diodes; Electronic equipment testing; Electrostatics; Filters; Instruments; Monitoring; Protons; Silicon;
Conference_Titel :
Microsystems and Nanoelectronics Research Conference, 2008. MNRC 2008. 1st
Conference_Location :
Ottawa, Ont.
Print_ISBN :
978-1-4244-2920-2
Electronic_ISBN :
978-1-4244-2921-9
DOI :
10.1109/MNRC.2008.4683381
