DocumentCode
3513965
Title
αRAM: An α particle detecting MOS IC for radon monitoring
Author
Griffin, R.H. ; Le, H. ; Jack, D.T. ; Tarr, N.G.
Author_Institution
Dept. of Electron., Carleton Univ., Ottawa, ON
fYear
2008
fDate
15-15 Oct. 2008
Firstpage
73
Lastpage
76
Abstract
A custom integrated circuit (ldquoalphaRAMrdquo) capable of detecting the alpha particles emitted in the decay of radon and its progeny has been designed, fabricated and successfully tested. The alphaRAM has been incorporated in a complete radon monitor using electrostatic concentration of radon progeny. The monitor can detect hazardous levels of radon within hours.
Keywords
MOS integrated circuits; application specific integrated circuits; particle detectors; radioactive decay periods; radon; MOS integrated circuit; Rn; alpha particle detection; alphaRAM; custom integrated circuit; electrostatic concentration; radon decay; radon monitoring; radon progeny; Circuit testing; Detectors; Diodes; Electronic equipment testing; Electrostatics; Filters; Instruments; Monitoring; Protons; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems and Nanoelectronics Research Conference, 2008. MNRC 2008. 1st
Conference_Location
Ottawa, Ont.
Print_ISBN
978-1-4244-2920-2
Electronic_ISBN
978-1-4244-2921-9
Type
conf
DOI
10.1109/MNRC.2008.4683381
Filename
4683381
Link To Document