DocumentCode :
3514025
Title :
Snow depth measurement using the structured pattern generator
Author :
Ryu, HwangRyol ; Yoo, KiSung ; Lim, ZongSu
Author_Institution :
Res. Inst. of Ind. Sci. & Technol., Pohang, South Korea
fYear :
2009
fDate :
3-5 Nov. 2009
Firstpage :
2715
Lastpage :
2720
Abstract :
This paper describes a snow depth measurement mechanism utilizing the high power laser diode module with the grid pattern generator mounted at the laser head and CCD camera with a dark red band-pass filter which blocks UV and shorter visible wavelengths and passes longer wavelengths of light between 660mm and 680mm wavelengths. The proposed snow measurement algorithms are based on the laser triangulation method and data fusion method with the grid pattern image and laser. The developed snow measurement device is developed to overcome the limitation in which the traditional snow depth measurement systems only profiled the local point or area over the snow surface. To implement the area-based snow depth measurement, the proposed system is operated along the vertical axis to scan the pre-defined height position between the ground and 1500mm and within this interval, the system measures the height of the snow plate, which simulates the snow depth as accurately as 1.2mm resolution. Consequently, we have done successful experiments on snow measurements using laser and camera. Moreover, we have evaluated this device under snowfall for further studying.
Keywords :
CCD image sensors; band-pass filters; geophysical techniques; remote sensing by laser beam; semiconductor lasers; sensor fusion; snow; CCD camera; dark red band pass filter; data fusion; laser diode module; laser triangulation; snow depth measurement; structured pattern generator; Area measurement; Diode lasers; Fusion power generation; Laser fusion; Mesh generation; Position measurement; Power generation; Power measurement; Snow; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
Conference_Location :
Porto
ISSN :
1553-572X
Print_ISBN :
978-1-4244-4648-3
Electronic_ISBN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2009.5415428
Filename :
5415428
Link To Document :
بازگشت