Title :
Highly efficient GaN-HEMT power amplifiers at 3.5 GHz and 5.5 GHz
Author :
Saad, Paul ; Nemati, Hossein Mashad ; Andersson, Kristoffer ; Fager, Christian
Author_Institution :
Dept. of Microtechnol. & Nanosci., Chalmers Univ. of Technol., Gothenburg, Sweden
Abstract :
This paper reports the design, implementation, and experimental results of two high efficiency GaN-HEMT power amplifiers (PAs) at 3.5 GHz and 5.5 GHz. A bare-die approach is used to eliminate package parasitics in conjunction with an in-house transistor model that enables investigation of the transistor intrinsic waveforms. With this as a basis, harmonic source-pull/load-pull simulations have been used to design and implement two state-of-the-art highly efficient harmonically tuned PAs. For the 3.5-GHz PA, large-signal measurement results show a PAE of 80%, a power gain of 15.5 dB, and an output power of 7 W, while for the 5.5-GHz PA, 5.6 W output power, 12.5 dB power gain, and 70% PAE are achieved.
Keywords :
III-V semiconductors; electronics packaging; gallium compounds; high electron mobility transistors; microwave field effect transistors; microwave power amplifiers; semiconductor device models; wide band gap semiconductors; GaN; GaN-HEMT power amplifiers; bare-die approach; efficiency 70 percent; efficiency 80 percent; frequency 3.5 GHz; frequency 5.5 GHz; gain 12.5 dB; gain 15.5 dB; harmonic source-pull-load-pull simulations; in-house transistor model; package parasitic elimination; power 5.6 W; power 7 W; transistor intrinsic waveforms; HEMTs; Microwave FET integrated circuits; Microwave amplifiers; Microwave integrated circuits; Performance evaluation; gallium nitride (GaN); harmonic termination; high electron mobility transistor (HEMT); power amplifier (PA); power-added efficiency (PAE);
Conference_Titel :
Wireless and Microwave Technology Conference (WAMICON), 2011 IEEE 12th Annual
Conference_Location :
Clearwater Beach, FL
Print_ISBN :
978-1-61284-081-9
DOI :
10.1109/WAMICON.2011.5872865