DocumentCode
3514133
Title
Reliability demonstration test model for binomial system with reliability growth
Author
Wu, Xiaoyue
Author_Institution
Coll. of Inf. Syst. & Manage., Nat. Univ. of Defense Technol., Changsha, China
fYear
2009
fDate
20-24 July 2009
Firstpage
367
Lastpage
369
Abstract
Many complex engineering systems have reliability growth in successive test stages. In most existing reliability demonstration test models, reliability growth is not incorporated as modeling assumption. In this paper, for binomial system with 2 test stages, a reliability demonstration test model is presented that naturally takes possible reliability growth into consideration. Likelihood ratios are defined for various possible situations, and statistical decision rules are derived. With a given example, the relative lower decision risk of the proposed model is illustrated by comparison with that of classical demonstration test model.
Keywords
decision theory; reliability theory; statistical testing; binomial system; likelihood ratio; reliability demonstration test model; reliability growth; statistical decision rule; Educational institutions; Electronic mail; Engineering management; Information management; Management information systems; Predictive models; Reliability engineering; System testing; Systems engineering and theory; Technology management; binomial system; demonstration test; discrete reliability growth model;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-4903-3
Electronic_ISBN
978-1-4244-4905-7
Type
conf
DOI
10.1109/ICRMS.2009.5270170
Filename
5270170
Link To Document