DocumentCode :
3514133
Title :
Reliability demonstration test model for binomial system with reliability growth
Author :
Wu, Xiaoyue
Author_Institution :
Coll. of Inf. Syst. & Manage., Nat. Univ. of Defense Technol., Changsha, China
fYear :
2009
fDate :
20-24 July 2009
Firstpage :
367
Lastpage :
369
Abstract :
Many complex engineering systems have reliability growth in successive test stages. In most existing reliability demonstration test models, reliability growth is not incorporated as modeling assumption. In this paper, for binomial system with 2 test stages, a reliability demonstration test model is presented that naturally takes possible reliability growth into consideration. Likelihood ratios are defined for various possible situations, and statistical decision rules are derived. With a given example, the relative lower decision risk of the proposed model is illustrated by comparison with that of classical demonstration test model.
Keywords :
decision theory; reliability theory; statistical testing; binomial system; likelihood ratio; reliability demonstration test model; reliability growth; statistical decision rule; Educational institutions; Electronic mail; Engineering management; Information management; Management information systems; Predictive models; Reliability engineering; System testing; Systems engineering and theory; Technology management; binomial system; demonstration test; discrete reliability growth model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4903-3
Electronic_ISBN :
978-1-4244-4905-7
Type :
conf
DOI :
10.1109/ICRMS.2009.5270170
Filename :
5270170
Link To Document :
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