• DocumentCode
    3514133
  • Title

    Reliability demonstration test model for binomial system with reliability growth

  • Author

    Wu, Xiaoyue

  • Author_Institution
    Coll. of Inf. Syst. & Manage., Nat. Univ. of Defense Technol., Changsha, China
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    367
  • Lastpage
    369
  • Abstract
    Many complex engineering systems have reliability growth in successive test stages. In most existing reliability demonstration test models, reliability growth is not incorporated as modeling assumption. In this paper, for binomial system with 2 test stages, a reliability demonstration test model is presented that naturally takes possible reliability growth into consideration. Likelihood ratios are defined for various possible situations, and statistical decision rules are derived. With a given example, the relative lower decision risk of the proposed model is illustrated by comparison with that of classical demonstration test model.
  • Keywords
    decision theory; reliability theory; statistical testing; binomial system; likelihood ratio; reliability demonstration test model; reliability growth; statistical decision rule; Educational institutions; Electronic mail; Engineering management; Information management; Management information systems; Predictive models; Reliability engineering; System testing; Systems engineering and theory; Technology management; binomial system; demonstration test; discrete reliability growth model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-4903-3
  • Electronic_ISBN
    978-1-4244-4905-7
  • Type

    conf

  • DOI
    10.1109/ICRMS.2009.5270170
  • Filename
    5270170