Success ratio sequential test plan using development test data

Success ratio sequential sampling plan is a common test plan for reliability compliance test. The standard sampling inspection used in practical project for reliability compliance test is difficult for application due to the cost and total sample size, especially for complex systems. While the test data acquired in product development phase is abundant. Thus using these data in reliability compliance test can reduce sample size and cost. This paper adopted a method called success ratio sequential sampling plan, which transformed the data acquired in product development phase to the equivalent actual data using ldquosimilarity coefficientrdquo, and integrated the equivalent actual data to the real compliance test data using Bayesian statistical formula. A simulation revealed that the data acquired in product development phase could be effectively used and the sequential compliance test sample size could be reduced compared with the traditional compliance test.