Title :
Series resistance modeling of complex metallization geometries of solar cells using conductive line decomposition
Author :
Wong, Johnson ; Mueller, Thomas ; Sridharan, Ranjani ; Zhang, Xueling ; Yang, Yang ; Feng, Zhiqiang ; Huang, Qiang ; Verlinden, Pierre ; Aberle, Armin G.
Author_Institution :
Solar Energy Res. Inst. of Singapore (SERIS), Nat. Univ. of Singapore, Singapore, Singapore
Abstract :
All-back-contact (ABC), metal wrap through (MWT) and generally solar cell designs with complex metallization geometries are not amenable to simple series resistance (Rs) analysis based on small unit cells. In order to accurately determine the effects of Rs in these solar cells, SERIS developed a MATLAB program that captures the cell metallization geometry from rastered images, and breaks down the metalized areas into line segments of appropriate conductance. Its chief advantages over the conventional finite element method (FEM) solvers are: many-fold reduction in the number of mesh points used to define the metalized area and that the connections between elements are clearly defined, thus enabling approximations in the current flow pattern to speed up computation if desired. Its chief advantage over network/SPICE solvers is better adaptivity to complex metal geometries. The program solves for the terminal current-voltage characteristics, as well as the local current density, voltage and series resistance distributions, making it a versatile tool to aid the design of metal patterns.
Keywords :
current density; current distribution; finite element analysis; metallisation; solar cells; voltage distribution; ABC; FEM solvers; MWT; Matlab program; SPICE solvers; all-back-contact; cell metallization geometry; complex metallization geometry; conductive line decomposition; finite element method; local current density distributions; mesh points; metal pattern design; metal wrap through; series resistance analysis modeling; series resistance distributions; solar cell design; terminal current-voltage characteristics; voltage distributions; Current density; Finite element methods; Geometry; Metallization; Photovoltaic cells; Resistance; all back contact solar cells; metallization; modeling; series resistance;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-0064-3
DOI :
10.1109/PVSC.2012.6317665