DocumentCode
3514305
Title
EMI noise attenuation prediction with mask impedance in motor drive system
Author
Wang, Ruxi ; Blanchette, Handy Fortin ; Boroyevich, Dushan ; Mattavelli, Paolo
Author_Institution
Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fYear
2012
fDate
5-9 Feb. 2012
Firstpage
2279
Lastpage
2284
Abstract
This paper presents insertion gain predictions for both the differential mode (DM) and the common mode (CM) of an EMI filter. The proposed approach, essentially based on measurements, allows prediction of EMI filter performance for high-complexity converters without time-consuming simulations. The key idea is to use direct measurements to represent the complex system by an equivalent circuit in the frequency domain. The source impedance, which is the more complex part of this equivalent circuit because of its non-linear time variation, is carefully analyzed for continuous current mode (CCM) in boost configuration. This study shows that the source impedance is generally masked by external impedance and can be treated as a linear system. Experimental results for insertion gain prediction are included for second-order filters for both DM and CM on a three-phase SiC JFET Vienna/two-level converter.
Keywords
electromagnetic interference; equivalent circuits; motor drives; power convertors; silicon compounds; wide band gap semiconductors; EMI filter; EMI noise attenuation; SiC; common mode; continuous current mode; differential mode; equivalent circuit; high-complexity converters; insertion gain predictions; linear system; mask impedance; motor drive system; second-order filters; three-phase JFET Vienna/two-level converter; Delta modulation; Electromagnetic interference; Equivalent circuits; Impedance; Impedance measurement; Inductance; Noise; Active energy storage; Capacitive energy storage; High power density converter; Ripple energy; Single phase rectifier;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
Conference_Location
Orlando, FL
Print_ISBN
978-1-4577-1215-9
Electronic_ISBN
978-1-4577-1214-2
Type
conf
DOI
10.1109/APEC.2012.6166140
Filename
6166140
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