Title :
New Reprogrammable and Non-Volatile Radiation Tolerant FPGA: RTA3P
Author :
Rezgui, Sana ; Wang, J.J. ; Sun, Yinming ; Cronquist, Brian ; McCollum, John
Author_Institution :
Actel Corp., Mountain View, CA
Abstract :
Heavy-ion and proton test results utilizing novel test methodologies of reprogrammable and non-volatile flash-based FPGAs are presented and discussed. The 5 programmable architectures in the A3P FPGA-family were tested: I/O structures, FPGA Core, PLL, FROM and SRAM. Furthermore, the circuitry used for the programming and the erase of the A3P product was exercised in proton beams. The data shows no major concern or disruption to all of the circuit features for fluences lower than 1011 particles or TID higher than 15 Krad.
Keywords :
field programmable gate arrays; proton effects; radiation hardening (electronics); RTA3P; circuit features; nonvolatile radiation tolerant FPGA; proton beams; reprogrammable FPGA; Circuit testing; Field programmable gate arrays; Logic; Nonvolatile memory; Particle beams; Performance evaluation; Phase locked loops; Protons; Single event upset; Switches;
Conference_Titel :
Aerospace Conference, 2008 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
978-1-4244-1487-1
Electronic_ISBN :
1095-323X
DOI :
10.1109/AERO.2008.4526472