Title :
A single-stage off-line LED driver IC with hysteretic power factor correction control
Author :
Kang, Eunchul ; Kim, Jaeha
Author_Institution :
Inter-Univ. Semicond. Res. Center (ISRC), Seoul Nat. Univ., Seoul, South Korea
Abstract :
An off-line light-emitting diode (LED) driver circuit that adopts a modified boost converter architecture with hysteric current control for power factor correction (PFC) is described. It removes a bulky electrolytic capacitor, improving the lifetime and enabling direct regulation of the LED current. To reduce the size and manufacturing cost of the LED modules, the driver circuit is designed as a custom integrated circuit (IC) fabricated in a 1.0 μm 650V trench-isolated BCDMOS process with only a few external components. The initial prototype, however, showed LED´s reverse recovery current and inductor´s self-resonance problem due to the high-frequency, hard switching operation of the control circuit. A revised prototype with additional off-chip components demonstrated the feasibility of the proposed circuit and the performance of 96.3% peak power factor and 84.5% efficiency, when delivering 18W to a 360V LED string from a 220V AC supply.
Keywords :
BIMOS integrated circuits; electric current control; electrolytic capacitors; light emitting diodes; power factor correction; power inductors; switching convertors; LED module; LED reverse recovery current; LED string; boost converter architecture; bulky electrolytic capacitor; high frequency hard switching operation; hysteretic power factor correction control; hysteric current control circuit; inductor self resonance problem; integrated circuit fabrication; manufacturing cost; off-chip component; offline light emitting diode driver circuit design; power 18 W; single-stage offline LED driver IC; size 1.0 mum; trench-isolated BCDMOS process; voltage 220 V; voltage 360 V; voltage 650 V; Capacitors; Driver circuits; Inductors; Integrated circuits; Light emitting diodes; Lighting; Reactive power;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4577-1215-9
Electronic_ISBN :
978-1-4577-1214-2
DOI :
10.1109/APEC.2012.6166154