DocumentCode :
3514699
Title :
Research and development of stress-damage models library
Author :
Shan, Kunlun ; Shao, Jiang ; Li, Yonghong ; Xu, Ming
Author_Institution :
Quality Eng. Centre, CAPE, Beijing, China
fYear :
2009
fDate :
20-24 July 2009
Firstpage :
205
Lastpage :
207
Abstract :
The constitution and classification of stress-damage models based on POF (physics of failure) were discussed, and the investigation method and technical approach were brought forward, at last the establishment of stress-damage models library with commercial engineering software was illustrated while researching plan was carried out.
Keywords :
electronic engineering computing; failure analysis; stress effects; electronic product failure; physics of failure; stress-damage model library; Chemical analysis; Failure analysis; Life estimation; Physics; Reliability engineering; Research and development; Software libraries; Temperature; Testing; Thermal stresses; Physics of Failure (POF); Stress-damage models; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4903-3
Electronic_ISBN :
978-1-4244-4905-7
Type :
conf
DOI :
10.1109/ICRMS.2009.5270209
Filename :
5270209
Link To Document :
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