• DocumentCode
    351484
  • Title

    Thermal field-the source of the emergence of nonequilibrium charge carriers in semiconductors

  • Author

    Espejo, Gabino ; Volovichev, Igor ; Gurevich, Yuri G. ; Logvinov, G.N. ; Meriuts, Andrey ; Titov, Oleg Yu

  • Author_Institution
    Dept. de Fisica, CINVESTAV-IPN, Mexico City, Mexico
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    181
  • Abstract
    The new point of view on thermoelectric phenomena as a transport process of nonequilibrium charge carriers is presented. It is shown that Fermi quasilevels which characterize transport in system far from equilibrium can be nonmonotonic functions of coordinate. The role of recombination in forming of thermoelectric phenomena is discussed for the first time. It is shown that in the presence of thermal fields appears a new term in the expression for recombination which depends on the inhomogeneity of temperature. If electron and hole temperatures are different, which is a typical case in semiconductors, appears one more new term in the expression for recombination proportional to the difference of electron and hole temperatures. The new method for the characterization of semiconductor materials connected with measure of thermopower is proposed. It is shown that nonstationary thermal fields are most appropriate for this purpose
  • Keywords
    Fermi level; electron-hole recombination; semiconductors; thermoelectric power; Fermi quasilevel; electron-hole recombination; nonequilibrium charge carrier transport; semiconductor; thermal field; thermoelectric phenomena; thermopower; Charge carrier processes; Charge carriers; Chemicals; Kinetic theory; Radiative recombination; Semiconductor materials; Spontaneous emission; Surface resistance; Temperature; Thermoelectricity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
  • Conference_Location
    Nis
  • Print_ISBN
    0-7803-5235-1
  • Type

    conf

  • DOI
    10.1109/ICMEL.2000.840550
  • Filename
    840550