Title :
Understanding the role of grain boundaries in sulfide thin film solar cells with scanning probe microscopy
Author :
Li, J.B. ; Chawla, Vikas ; Clemens, B.M.
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
Abstract :
Grain boundaries (GBs) in Cu(In,Ga)Se2 (CIGS) and CdTe thin film solar cells are known to be beneficial for achieving high conversion efficiencies. In this work, we will show that Cu2ZnSnS4 (CZTS) and Cu2ZnSn(S,Se)4 (CZTSSe) solar cells have the same GB electronic properties as CIGS and CdTe. Scanning Kelvin Probe Microscopy (SKPM) measurements reveal a higher positive surface potential at the GBs as compared to the grain while Conductive Atomic Force Microscopy (C-AFM) measurements show higher current flow in the vicinity of the GBs. These two measurement results are similar to those obtained for CIGS and CdTe and together they demonstrate the enhanced minority carrier collection taking place at the GBs of CZTS and CZTSSe. This implies that CZTS and CZTSSe solar cells have the potential to achieve the high efficiencies that CIGS and CdTe solar cells enjoy.
Keywords :
atomic force microscopy; cadmium compounds; copper compounds; gallium compounds; grain boundaries; indium compounds; minority carriers; scanning probe microscopy; semiconductor thin films; solar cells; surface potential; ternary semiconductors; tin compounds; zinc compounds; C-AFM measurements; CdTe; Cu2ZnSnS4; Cu2ZnSnSe4; CuGaSe2; CuInSe2; GB electronic properties; SKPM measurements; conductive atomic force microscopy; enhanced minority carrier collection; grain boundaries; positive surface potential; scanning Kelvin probe microscopy; sulfide thin film solar cells; Current measurement; Films; Grain boundaries; Microscopy; Photovoltaic cells; Surfaces; C-AFM; CZTS; CZTSSe; SKPM; grain boundaries; photovoltaic cells; solar cells;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-0064-3
DOI :
10.1109/PVSC.2012.6317697