DocumentCode
3514847
Title
Results for an Al/AlN composite 350°C SiC solid-state circuit breaker module
Author
Bhat, Krishna P. ; Guo, Yuan-Bo ; Xu, Yang ; Baltis, Theodore ; Hazelmyer, Donald R. ; Hopkins, Douglas C.
fYear
2012
fDate
5-9 Feb. 2012
Firstpage
2492
Lastpage
2498
Abstract
This paper describes final results for the verification and testing of a SiC MOSFET-based solid-state circuit breaker power module for ultra-fast current interruption. The module exhibited a single-die (4.1mm × 4.1 mm) 48 A, 5 ms trip point from a 300 V bus with a di/dt of 2.1 kA/us (23 ns opening time). An internal snubber increased the response to 390 ns. The die absorbed ~4.6 J causing a transient junction temperature increase of ~245 °C. Ambient was set at 25 °C and 105 °C. Hence, maximum junction temperature was conservatively projected to reach 350 °C during the 5 ms pulse. An Aluminum composite structure was used for high temperature thermal management and high reliability. Testing of the final module surpassed 750 total cycles. Electrical, thermal and mechanical design and testing results are presented.
Keywords
MOSFET circuits; aluminium compounds; circuit breakers; silicon compounds; thermal management (packaging); wide band gap semiconductors; Al-AlN; MOSFET-based solid-state circuit breaker power module; SiC; current 48 A; energy 4.6 J; high temperature thermal management; size 4.1 mm; temperature 105 C; temperature 245 C; temperature 25 C; temperature 350 C; time 23 ns; time 390 ns; time 5 ms; ultra-fast current interruption; voltage 300 V; Aluminum; Ceramics; Copper; Silicon carbide; Stress; Substrates; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
Conference_Location
Orlando, FL
Print_ISBN
978-1-4577-1215-9
Electronic_ISBN
978-1-4577-1214-2
Type
conf
DOI
10.1109/APEC.2012.6166172
Filename
6166172
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