Title :
Diagnostics of large-area solar cells by local irradiation
Author :
Radil, Jan ; Benda, Vítezslav
Author_Institution :
Dept. of Electrotechnol., Czech Tech. Univ., Prague, Czech Republic
Abstract :
This paper presents a method for determining of local defects, which bring down efficiency and reliability of solar cells, using local irradiation of the surface of large-area solar cells. The method can give information about position and extent of local defects. Photovoltaic voltage generated by local irradiation is decreased in the area of local defects and so local defects can be determined
Keywords :
semiconductor device measurement; solar cells; diagnosis; efficiency; large-area solar cell; local defects; local irradiation; photovoltaic voltage; reliability; Area measurement; Charge carrier lifetime; Noise measurement; Photovoltaic cells; Photovoltaic systems; Position measurement; Solar power generation; Time measurement; Voltage measurement; Wavelength measurement;
Conference_Titel :
Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
Conference_Location :
Nis
Print_ISBN :
0-7803-5235-1
DOI :
10.1109/ICMEL.2000.840556
