Title :
Comparative analysis of commercially available silicon carbide transistors
Author :
Lemmon, Andrew ; Mazzola, Michael ; Gafford, James ; Speer, Kevin M.
Author_Institution :
Center for Adv. Vehicular Syst., Mississippi State Univ., Starkville, MS, USA
Abstract :
Since the release of power SiC JFETs in 2008 and power SiC MOSFETs in 2011, there are now more choices of SiC power transistors than ever before available to industrial power electronics markets. To inform prospective users, this paper surveys critical factors influencing the adoption of silicon carbide transistors for a wide range of power electronics applications. Citing publicly available documents, the analysis uses five key factors to compare and contrast the industrial viability of existing SiC transistor technologies: performance, availability, reliability, adoptability, and affordability. Special attention is devoted to the SiC transistors currently available to the commercial market, and the aspects of these devices related to the viability criteria are discussed.
Keywords :
junction gate field effect transistors; power MOSFET; silicon compounds; wide band gap semiconductors; SiC; industrial power electronics markets; industrial viability; power JFET; power MOSFET; power electronics applications; power transistors; silicon carbide transistors; JFETs; Logic gates; MOSFETs; Performance evaluation; Resistance; Silicon carbide; Switches;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4577-1215-9
Electronic_ISBN :
978-1-4577-1214-2
DOI :
10.1109/APEC.2012.6166175