Complete analysis of the complex and arbitrary bilateral finlines

Author

Fernandes, Humberto Cesar Chaves ; de Albuquerque Sales Neto, Jarbas

Author_Institution

Dept. of Electr. Eng., Univ. Fed. do Rio Grande do Norte, Natal, Brazil

Volume

2

fYear

1998

fDate

9-13 Aug 1998

Firstpage

415

Abstract

An electromagnetic application is developed to obtain the effective dielectric constant, the attenuation constant and the characteristic impedance of the arbitrary bilateral fin lines with semiconductor substrate and conductor thickness simultaneity for the first time. Also the concise transverse transmission line (TTL) full wave method is used in the analysis. New results of the complex propagation and of the characteristic impedance as functions of the frequency and different dimensions and conductivity of the substrate, are obtained in 3D

Keywords

electric impedance; electromagnetic fields; electromagnetic wave propagation; fin lines; permittivity; substrates; transmission lines; 3D; arbitrary bilateral fin lines; attenuation constant; characteristic impedance; complex propagation; conductor thickness simultaneity; effective dielectric constant; electromagnetic application; full wave method; semiconductor substrate; transverse transmission line; Attenuation; Boundary conditions; Conductors; Current density; Dielectric constant; Dielectric substrates; Electromagnetic fields; Equations; Finline; Impedance;

fLanguage

English

Publisher

ieee

Conference_Titel

Telecommunications Symposium, 1998. ITS '98 Proceedings. SBT/IEEE International

Conference_Location

Sao Paulo

Print_ISBN

0-7803-5030-8

Type

conf

DOI

10.1109/ITS.1998.718428

Filename

718428