Title :
Complete analysis of the complex and arbitrary bilateral finlines
Author :
Fernandes, Humberto Cesar Chaves ; de Albuquerque Sales Neto, Jarbas
Author_Institution :
Dept. of Electr. Eng., Univ. Fed. do Rio Grande do Norte, Natal, Brazil
Abstract :
An electromagnetic application is developed to obtain the effective dielectric constant, the attenuation constant and the characteristic impedance of the arbitrary bilateral fin lines with semiconductor substrate and conductor thickness simultaneity for the first time. Also the concise transverse transmission line (TTL) full wave method is used in the analysis. New results of the complex propagation and of the characteristic impedance as functions of the frequency and different dimensions and conductivity of the substrate, are obtained in 3D
Keywords :
electric impedance; electromagnetic fields; electromagnetic wave propagation; fin lines; permittivity; substrates; transmission lines; 3D; arbitrary bilateral fin lines; attenuation constant; characteristic impedance; complex propagation; conductor thickness simultaneity; effective dielectric constant; electromagnetic application; full wave method; semiconductor substrate; transverse transmission line; Attenuation; Boundary conditions; Conductors; Current density; Dielectric constant; Dielectric substrates; Electromagnetic fields; Equations; Finline; Impedance;
Conference_Titel :
Telecommunications Symposium, 1998. ITS '98 Proceedings. SBT/IEEE International
Conference_Location :
Sao Paulo
Print_ISBN :
0-7803-5030-8
DOI :
10.1109/ITS.1998.718428
