DocumentCode :
3515049
Title :
Qualification of arcing risks in PV modules
Author :
Reil, F. ; Sepanski, A. ; Herrmann, W. ; Althaus, J. ; Vaassen, W. ; Schmidt, H.
Author_Institution :
TUV Rheinland Energie und Umwelt GmbH, Cologne, Germany
fYear :
2012
fDate :
3-8 June 2012
Abstract :
The work presented was carried out within a current German research project at TÜV Rheinland in Germany together with the Fraunhofer Institute ISE and the Fire Department of Munich, which examines fire risks and determines enhanced safety measures for PV systems. In principle, contact defects (due to production faults or thermo-mechanical fatigue) in the DC circuit of a module can be named as potential sources of arcs during the operating lifetime. This work reflects general strategies for qualifying risks at cell connectors in general and transfers them to arcing risks in PV modules. To generate technical data, 20 crystalline PV modules with soldering defects were exposed to different test sequences to reproduce similar faults such as focal overheating or even electric arcs. On this basis, combinations of dynamic mechanical or thermo-mechanical loads were applied with a forward bias to induce stressing on the current-carrying parts and connector joints in a module. The derivation of a potentially useful test method is given and production-oriented quality monitoring measures are proposed.
Keywords :
arcs (electric); electrical contacts; mechanical contact; photovoltaic power systems; risk analysis; soldering; 20 crystalline PV module; DC circuit; Fraunhofer Institute ISE; German research project; TOV Rheinland; arcing risk qualification; contact defects; current-carrying part; dynamic mechanical; even electric arcs; focal overheating; production-oriented quality monitoring; soldering defects; test sequences; thermo-mechanical loads; Connectors; Contacts; Fires; Indexes; Loading; Loss measurement; Standards; Fires; Modules;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6317709
Filename :
6317709
Link To Document :
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