Title :
Multi-state component importance analysis using multi-state multi-valued decision diagrams
Author :
Shrestha, Akhilesh ; Xing, Liudong ; Coit, David W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts Dartmouth, Dartmouth, MA, USA
Abstract :
Component importance analysis helps identify the vulnerabilities within a system and quantify the criticality of the system components. Multistate component importance analysis poses unique challenges to the existing methods that are primarily based on binary state applications. This paper presents a multistate multivalued decision diagram based analytical method for multistate component importance analysis. The advantages of the proposed method are illustrated through the comparison to a Monte Carlo simulation based method and the detailed analysis of a case study.
Keywords :
Monte Carlo methods; decision diagrams; reliability theory; Monte Carlo simulation based method; binary state application; multistate component importance analysis; multistate multivalued decision diagram; Analytical models; Application software; Computer integrated manufacturing; Design optimization; Modeling; Monte Carlo methods; Particle measurements; Reliability; Risk management; Systems engineering and theory; Monte Carlo simulation; composite importance measure (CIM); multi-state multi-valued decision diagram (MMDD); multi-state system (MSS);
Conference_Titel :
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4903-3
Electronic_ISBN :
978-1-4244-4905-7
DOI :
10.1109/ICRMS.2009.5270231
