DocumentCode :
3515134
Title :
In-situ temperature monitoring for process control in laser assisted polymer bonding for MEMS packaging
Author :
Liu, Yufei ; Zeng, Lun ; Wang, Changhai
Author_Institution :
Sch. of Eng. & Phys. Sci., Heriot Watt Univ., Edinburgh
fYear :
2008
fDate :
1-4 Sept. 2008
Firstpage :
199
Lastpage :
204
Abstract :
Laser assisted polymer bonding is a novel promising technique for MEMS packaging. In this method, a thermally cured polymer seal using localised laser heating is used to produce a microcavity between a capping substrate and a MEMS chip or wafer. The cavity is necessary to protect the fragile micromechanical structures of the MEMS devices in the subsequent manufacturing processes after wafer fabrication and to provide a stable environment for operation. The laser based bonding method is a fast process and can reduce/eliminate the potential damage to temperature sensitive devices during packaging. However, due to the localised nature of the temperature rise it is difficult to monitor the temperature change precisely during the bonding process using conventional methods. In this paper we present the development of thin film miniature temperature sensors for in-situ processing monitoring in the laser assisted polymer bonding process for MEMS packaging. Distributed temperature sensors are fabricated on the substrate and are successfully used to monitor the in-situ temperature rise and distribution in the bonding process.
Keywords :
bonding processes; electronic products; electronics packaging; micromechanical devices; process monitoring; temperature sensors; MEMS packaging; distributed temperature sensors; in-situ temperature monitoring; laser based bonding method; localised laser heating; manufacturing processes; microcavity; micromechanical structures; process control; thermal cured polymer seal; thin film miniature temperature sensors; wafer fabrication; Bonding processes; Micromechanical devices; Packaging; Polymer films; Process control; Seals; Substrates; Temperature measurement; Temperature sensors; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
Conference_Location :
Greenwich
Print_ISBN :
978-1-4244-2813-7
Electronic_ISBN :
978-1-4244-2814-4
Type :
conf
DOI :
10.1109/ESTC.2008.4684349
Filename :
4684349
Link To Document :
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