• DocumentCode
    3515134
  • Title

    In-situ temperature monitoring for process control in laser assisted polymer bonding for MEMS packaging

  • Author

    Liu, Yufei ; Zeng, Lun ; Wang, Changhai

  • Author_Institution
    Sch. of Eng. & Phys. Sci., Heriot Watt Univ., Edinburgh
  • fYear
    2008
  • fDate
    1-4 Sept. 2008
  • Firstpage
    199
  • Lastpage
    204
  • Abstract
    Laser assisted polymer bonding is a novel promising technique for MEMS packaging. In this method, a thermally cured polymer seal using localised laser heating is used to produce a microcavity between a capping substrate and a MEMS chip or wafer. The cavity is necessary to protect the fragile micromechanical structures of the MEMS devices in the subsequent manufacturing processes after wafer fabrication and to provide a stable environment for operation. The laser based bonding method is a fast process and can reduce/eliminate the potential damage to temperature sensitive devices during packaging. However, due to the localised nature of the temperature rise it is difficult to monitor the temperature change precisely during the bonding process using conventional methods. In this paper we present the development of thin film miniature temperature sensors for in-situ processing monitoring in the laser assisted polymer bonding process for MEMS packaging. Distributed temperature sensors are fabricated on the substrate and are successfully used to monitor the in-situ temperature rise and distribution in the bonding process.
  • Keywords
    bonding processes; electronic products; electronics packaging; micromechanical devices; process monitoring; temperature sensors; MEMS packaging; distributed temperature sensors; in-situ temperature monitoring; laser based bonding method; localised laser heating; manufacturing processes; microcavity; micromechanical structures; process control; thermal cured polymer seal; thin film miniature temperature sensors; wafer fabrication; Bonding processes; Micromechanical devices; Packaging; Polymer films; Process control; Seals; Substrates; Temperature measurement; Temperature sensors; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
  • Conference_Location
    Greenwich
  • Print_ISBN
    978-1-4244-2813-7
  • Electronic_ISBN
    978-1-4244-2814-4
  • Type

    conf

  • DOI
    10.1109/ESTC.2008.4684349
  • Filename
    4684349