• DocumentCode
    3515301
  • Title

    In-plane miniband formation of Si Nanodisc and its application in intermediate band photovoltaic

  • Author

    Hu, Weiguo ; Budiman, Mohd F. ; Igarashi, Makoto ; Lee, Mingyi ; Li, Yiming ; Samukawa, Seiji

  • Author_Institution
    Inst. of Fluid Sci., Tohoku Univ., Sendai, Japan
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    With the envelope-function theory, the finite element method is developed to calculate the electronic structure of the Si Nanodisc. In the 1D quantum well superlattice, our FEM results well match with the classic Kronig-Penney method. However, the Kronig-Penney method can deal with the high-dimensional and complex geometry shape. Even if adopting the independent potential approximation, the Kronig-Penney method overestimated the potential in the diagonal boundary to underestimate the miniband formation. Our FEM is suitable to calculate the electronic structure in the realistic QD superlattice. And with the finite design, the Si/SiC ND can work as the single-level IBSC, whose limitation efficiency is 43.81% in the structure with 2 nm thickness and 3 nm diameter.
  • Keywords
    Kronig-Penney model; approximation theory; electronic structure; elemental semiconductors; finite element analysis; nanotechnology; semiconductor quantum wells; semiconductor superlattices; silicon; solar cells; 1D quantum well superlattice; FEM; Kronig-Penney method; Si; complex geometry shape; diagonal boundary; efficiency 43.81 percent; envelope-function theory; finite element method; high-dimensional geometry shape; in-plane miniband formation; independent potential approximation; intermediate band photovoltaic cells; nanodisc electronic structure; single-level IBSC; size 2 nm; size 3 nm; Finite element methods; Photovoltaic cells; Photovoltaic systems; Quantum dots; Silicon; Superlattices; intermediate band photovoltaic; miniband; quantum dot; silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6317723
  • Filename
    6317723