DocumentCode
3515301
Title
In-plane miniband formation of Si Nanodisc and its application in intermediate band photovoltaic
Author
Hu, Weiguo ; Budiman, Mohd F. ; Igarashi, Makoto ; Lee, Mingyi ; Li, Yiming ; Samukawa, Seiji
Author_Institution
Inst. of Fluid Sci., Tohoku Univ., Sendai, Japan
fYear
2012
fDate
3-8 June 2012
Abstract
With the envelope-function theory, the finite element method is developed to calculate the electronic structure of the Si Nanodisc. In the 1D quantum well superlattice, our FEM results well match with the classic Kronig-Penney method. However, the Kronig-Penney method can deal with the high-dimensional and complex geometry shape. Even if adopting the independent potential approximation, the Kronig-Penney method overestimated the potential in the diagonal boundary to underestimate the miniband formation. Our FEM is suitable to calculate the electronic structure in the realistic QD superlattice. And with the finite design, the Si/SiC ND can work as the single-level IBSC, whose limitation efficiency is 43.81% in the structure with 2 nm thickness and 3 nm diameter.
Keywords
Kronig-Penney model; approximation theory; electronic structure; elemental semiconductors; finite element analysis; nanotechnology; semiconductor quantum wells; semiconductor superlattices; silicon; solar cells; 1D quantum well superlattice; FEM; Kronig-Penney method; Si; complex geometry shape; diagonal boundary; efficiency 43.81 percent; envelope-function theory; finite element method; high-dimensional geometry shape; in-plane miniband formation; independent potential approximation; intermediate band photovoltaic cells; nanodisc electronic structure; single-level IBSC; size 2 nm; size 3 nm; Finite element methods; Photovoltaic cells; Photovoltaic systems; Quantum dots; Silicon; Superlattices; intermediate band photovoltaic; miniband; quantum dot; silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location
Austin, TX
ISSN
0160-8371
Print_ISBN
978-1-4673-0064-3
Type
conf
DOI
10.1109/PVSC.2012.6317723
Filename
6317723
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