DocumentCode :
3515339
Title :
Optical bandgap tuning of ICPCVD-made silicon nanocrystals for next generation photovoltaics
Author :
Mavilla, Narasimha Rao ; Rai, Dharmendra K R ; Solanki, Chetan Singh ; Vasi, J.
Author_Institution :
Nat. Centre for Photovoltaic Res. & Educ., IIT Bombay, Mumbai, India
fYear :
2012
fDate :
3-8 June 2012
Abstract :
Superior optical properties of Si-Nanocrystals (Si-NCs) compared to bulk Si, particularly tunability of bandgap by controlling size, can be exploited for realizing next generation “all-Si” tandem solar cells [1]. In this study, we present optical bandgap tunability of Si-NCs made by Inductively Coupled Plasma Enhanced Chemical Vapor Deposition (ICPCVD) using SiO2/SiOx superlattice approach [2]. Deposition time of SiOx sublayer, and hence the related thickness (TSRO), was used as a variable parameter to realize Si-NCs of varying sizes. All multilayer (ML) samples were subsequently furnace annealed at 900°C, to allow for Si-NC formation. Formation of Si-NCs was confirmed by Raman spectroscopy. Transmittance, reflectance and absorptance spectra indicated gradual increase of bandgap with decreasing TSRO. Optical bandgap, ETauc, estimated using Tauc analysis showed an increase in optical bandgap from 1.45 eV to 2.5 eV, as TSRO was varied from 10 nm to 2 nm respectively.
Keywords :
Raman spectroscopy; elemental semiconductors; nanostructured materials; plasma CVD; silicon; solar cells; ICPCVD-made silicon nanocrystals; Raman spectroscopy; Si; Tauc analysis; absorptance spectra; electron volt energy 1.45 eV to 2.5 eV; inductively coupled plasma enhanced chemical vapor deposition; multilayer samples; next generation photovoltaics; next generation tandem solar cells; optical bandgap tunability; optical bandgap tuning; superior optical properties; superlattice approach; Annealing; Integrated optics; Maximum likelihood estimation; Optical films; Optical losses; Phonons; “All-Si” tandem solar cell; ICPCVD; Next generation photovoltaics; Raman Spectroscopy; Silicon Nanocrystal; UV-Vis Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6317726
Filename :
6317726
Link To Document :
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