• DocumentCode
    3515519
  • Title

    Impact of interface recombination on time resolved photoluminescence (TRPL) decays in CdTe solar cells (numerical simulation analysis)

  • Author

    Kanevce, Ana ; Kuciauskas, Darius ; Gessert, Timothy A. ; Levi, Dean H. ; Albin, David S.

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    Using Sentaurus Device Software, we analyze how bulk and interface recombination affect time-resolved photoluminescence (TRPL) decays in CdTe solar cells. This modeling analysis could improve the interpretation of TRPL data and increase the possibility of rapid defect characterization in thin-film solar cells. By illuminating the samples with photons of two different wavelengths, we try to deduce the spatial origin of the dominant recombination loss. Shorter-wavelength photons will be more affected by the interface recombination and drift compared to the longer ones. Using the two-wavelength TRPL characterization method, it may be possible to determine whether a specific change in deposition process has affected the properties of interface or the bulk of the absorber.
  • Keywords
    II-VI semiconductors; cadmium compounds; ion recombination; numerical analysis; photoluminescence; semiconductor thin films; solar cells; CdTe; Sentaurus device software; TRPL decays; deposition process; dominant recombination loss; interface recombination; numerical simulation analysis; rapid defect characterization; shorter-wavelength photons; solar cells; thin-film solar cells; time resolved photoluminescence decay; two-wavelength TRPL characterization method; Charge carrier lifetime; Charge carrier processes; Lighting; Numerical models; Semiconductor process modeling; Spontaneous emission; Wavelength measurement; CdTe; carrier lifetime; interface recombination; numerical simulations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6317736
  • Filename
    6317736