DocumentCode :
3515636
Title :
Phase change and electrical properties of thin films BaTiO3 system made by RF/DC magnetron sputtering
Author :
Song, Min-Jong ; Park, Choon-Bae ; Kim, Tae Wan
Author_Institution :
Kwangju Health Coll., South Korea
Volume :
2
fYear :
1997
fDate :
25 -30 May 1997
Firstpage :
1030
Abstract :
Thin films of the BaTiO3 system were prepared by radio frequency (RF)/DC magnetron sputtering method. We have investigated crystal structure, surface morphology and PTCR (positive-temperature coefficient of resistance) characteristics of the specimen depending on second heat-treatment temperatures. Second heat treatments of the specimen were performed in the temperature range of 400 to 1350°C. X-ray diffraction patterns of BaTiO3 thin films show that the specimen heat treated below 600°C is an amorphous phase and the one heat treated above 1100°C forms a crystal. In the specimen heat-treated at 1300°C, the lattice constant ratio c/a is 1.188. A scanning electron microscope (SEM) image of BaTiO3 thin films shows that the specimen heat treated in between 900 and 1100°C shows grain growth. At 1100°C, the specimen stops grain-growing and becomes a crystal. The resistivity-temperature characteristic of the specimen depends on the doping concentrations of Mn. A resistivity ratio between the value at room temperature and the one above Curie temperature is 104 for pure BaTiO3 thin films and 105 for BaTiO3:0.127 mol% MnO
Keywords :
X-ray diffraction; barium compounds; crystallisation; electrical resistivity; ferroelectric thin films; ferroelectric transitions; grain growth; heat treatment; scanning electron microscopy; sputter deposition; sputtered coatings; surface structure; 400 to 1350 C; BaTiO3; BaTiO3 thin film system; BaTiO3:Mn; Mn doping concentrations; PTCR characteristics; RF/DC magnetron sputtering; SEM image; X-ray diffraction patterns; amorphous phase; crystal structure; crystalline phase; electrical properties; grain growth; phase change; positive-temperature coefficient of resistance; resistivity-temperature characteristics; scanning electron microscopy; second heat-treatment temperatures; surface morphology; Amorphous magnetic materials; Electric resistance; Radio frequency; Scanning electron microscopy; Sputtering; Surface morphology; Surface resistance; Surface treatment; Temperature dependence; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-2651-2
Type :
conf
DOI :
10.1109/ICPADM.1997.616622
Filename :
616622
Link To Document :
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