Title :
Determination of moisture ingress through various encapsulants used in CIGS PV module under continuously varying environment
Author :
Kim, Namsu ; Han, Changwoon ; Lee, Jaehoon ; Baek, Dohyun ; Kim, Dongseop
Author_Institution :
Korea Electron. Res. Center, Seongnam, South Korea
Abstract :
It has been reported that water vapor ingress and saturation of encapsulant materials dominantly impact on longterm reliability of copper indium gallium selenide PV cells. To understand diffusion mechanism of water vapor into PV module, diffusion coefficient and solubililty of various encapsulants and their temperature dependency were investigated. Based on experimentally determined permeation properties, governing equation for time dependent diffusion were solved using finite element method software to suggest design guideline for packaging of PV module for long-term reliability.
Keywords :
copper compounds; diffusion; encapsulation; finite element analysis; gallium compounds; indium compounds; moisture; permeability; semiconductor device reliability; solar cells; solubility; ternary semiconductors; CIGS PV module; Cu(InGa)Se2; continuously varying environment; diffusion coefficient; diffusion mechanism; encapsulant material saturation; finite element method; moisture ingress determination; reliability; solubililty; water vapor ingress; Boundary conditions; Equations; Finite element methods; Glass; Mathematical model; Software; Transient analysis; CIGS PV module; Water vapor; diffusion coefficient; encapsulant; solubility;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-0064-3
DOI :
10.1109/PVSC.2012.6317744
