DocumentCode
3515736
Title
Wideband relative permittivity extraction based on CPW phase constant measurements
Author
Arz, Uwe ; Janezic, Michael D. ; Heinrich, Wolfgang
Author_Institution
Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany
fYear
2011
fDate
10-10 June 2011
Firstpage
1
Lastpage
3
Abstract
We introduce a semi-numerical method to extract the relative permittivity of typical microwave substrate materials from on-wafer scattering-parameter measurements of coplanar waveguides of different lengths. Despite its numerical nature, the method is robust and converges rapidly. We demonstrate the accuracy of the method using structures built on four different substrates in a frequency range up to 110 GHz.
Keywords
S-parameters; convergence of numerical methods; coplanar waveguides; microwave measurement; permittivity measurement; phase measurement; CPW; convergence; coplanar waveguides; microwave substrate materials; on-wafer scattering parameter measurement; phase constant measurement; semi-numerical method; wideband relative permittivity extraction; Coplanar waveguides; Frequency measurement; Gallium arsenide; Permittivity; Permittivity measurement; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurement Conference (ARFTG), 2011 77th ARFTG
Conference_Location
Baltimore, MD
Print_ISBN
978-1-61284-959-1
Electronic_ISBN
978-1-61284-960-7
Type
conf
DOI
10.1109/ARFTG77.2011.6034561
Filename
6034561
Link To Document