DocumentCode :
3515773
Title :
Measurements of micromachined waveguide devices at WR-3 band using a T/R-T module based network analyzer
Author :
Wang, Yi ; Lancaster, Michael J. ; Ke, Maolong ; Shang, Xiaobang
Author_Institution :
Sch. of Electron., Electr. & Comput. Eng., Univ. of Birmingham, Birmingham, UK
fYear :
2011
fDate :
10-10 June 2011
Firstpage :
1
Lastpage :
4
Abstract :
Making accurate and reliable measurements at WR-3 band is challenging. This is made more so when a T/R-T based test configuration is used. This paper compared the calibrations and measurements between a T/R-T and a full T/R-T/R configuration. The shortfall of load matching in the T/R-T configuration has been identified and described using signal flow analyses. The effects of both the device performance and the load match on the measurement uncertainty have been studied. The insertion of an attenuator at the T-module test port has been used to overcome the poor load matching, and significant improvements have been achieved on the measurements of micromachined waveguide devices.
Keywords :
calibration; measurement uncertainty; micromachining; millimetre wave devices; millimetre wave measurement; network analysers; T/R-T module; WR-3 band; attenuator; calibrations; load matching; measurement uncertainty; micromachined waveguide devices; network analyzer; signal flow analyses; Attenuation measurement; Attenuators; Calibration; Frequency measurement; Loss measurement; Measurement uncertainty; Millimeter wave measurements; Micromachining; Millimeter wave devices; Millimeter wave measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2011 77th ARFTG
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-959-1
Electronic_ISBN :
978-1-61284-960-7
Type :
conf
DOI :
10.1109/ARFTG77.2011.6034563
Filename :
6034563
Link To Document :
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