DocumentCode :
3515835
Title :
Proximity sensors utilizing an evanescent acoustic field formed by flexural plate waves
Author :
Hongo, Satoshi ; Naliamura, I. ; Hosokawa, Nobuyuki
Author_Institution :
Graduate Sch. of Eng., Tohoku Univ., Sendai, Japan
Volume :
1
fYear :
1997
fDate :
5-8 Oct 1997
Firstpage :
475
Abstract :
A proximity sensor utilizing an evanescent acoustic field formed by flexural plate waves is proposed. When an object comes into the evanescent field, the acoustic radiation admittance of the bending vibrator may change. Hence, the proximity sensing can be achieved by measuring the electrical admittance of the piezoelectric flexural vibrator. To confirm the characteristics of the proximity sensor, some experiments were carried out using a flexural vibrator consisting of a 140° rotated Y-cut LiNbO3 plate with a polarization-inverted layer. When an object was approached to the major surface of the vibrator, the admittance at a resonance of the bending vibrator decreased drastically according as the distance d between the object and the vibrator became short. On the other hand, when the object was approached to the tip of the vibrator, the Q-factor decreased in the range d>0.2 mm but increased again unexpectedly in the range d<0.2 mm
Keywords :
Q-factor; acoustic field; electric admittance measurement; piezoelectric transducers; position measurement; surface acoustic wave resonators; surface acoustic wave sensors; LiNbO3; Q-factor; Y-cut LiNbO3 plate; acoustic radiation admittance; bending vibrator; evanescent acoustic field; flexural plate waves; infinite plate; piezoelectric flexural vibrator; polarization-inverted layer; proximity sensor; resonance; surface approach mode; tip approach mode; Acoustic measurements; Acoustic sensors; Acoustic waves; Admittance measurement; Electric variables measurement; Piezoelectric polarization; Q factor; Resonance; Sensor phenomena and characterization; Vibration measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE
Conference_Location :
Toronto, Ont.
ISSN :
1051-0117
Print_ISBN :
0-7803-4153-8
Type :
conf
DOI :
10.1109/ULTSYM.1997.663066
Filename :
663066
Link To Document :
بازگشت