Adapter evaluation using three-adapter technique with ‘Thru-Line’ two-tier calibration in one-port measurements

Author

Kim, Jeong-Hwan ; Kang, Jin-Seob ; Kwon, Jae-Yong ; Kim, Dae-Chan

Author_Institution

Center for Electromagn. Wave, Korea Res. Inst. of Stand. & Sci. (KRISS), Daejeon, South Korea

fYear

2011

fDate

10-10 June 2011

Firstpage

1

Lastpage

7

Abstract

This paper presents a method using a two-tier calibration with `Thru-Line´ for evaluating the S-parameters of adapters based on three-adapter technique. It uses a one-port VNA (Vector Network Analyzer) to avoid cable movements with `OSL´ (Open-Short-Load) calibration standards, which are widely used for one-port measurements, being used at the first and second calibrations. Formulas are also derived for estimating the uncertainties of the S-parameters of adaptors using the proposed method.

Keywords

S-parameters; calibration; measurement uncertainty; microwave measurement; network analysers; OSL; S-parameters; VNA; adapter evaluation; one-port measurements; open-short-load; three-adapter technique; two-tier calibration; uncertainity estimation; vector network analyzer; Calibration; Equations; Frequency measurement; Mathematical model; Reflection; Scattering parameters; Standards;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Measurement Conference (ARFTG), 2011 77th ARFTG

Conference_Location

Baltimore, MD

Print_ISBN

978-1-61284-959-1

Electronic_ISBN

978-1-61284-960-7

Type

conf

DOI

10.1109/ARFTG77.2011.6034568

Filename

6034568