Title :
Integrated millimeter-wave photonic probes for an on-wafer network analyzer
Author :
Sahri, N. ; Nagatsuma, T. ; Furuta, T. ; Umeda, Y. ; Ishibashi, T.
Author_Institution :
NTT Telecommun. Energy Labs., Kanagawa, Japan
Abstract :
A new network analyzer based on ultrafast optoelectronic techniques is presented. It uses integrated and packaged mm-wave-photonic active probes and enables on-wafer measurements of scattering parameters with a bandwidth exceeding 300 GHz
Keywords :
MIMIC; integrated circuit packaging; integrated circuit testing; microwave photonics; millimetre wave measurement; network analysis; probes; 300 GHz; IC testing; integrated millimeter-wave photonic probes; integrated mm-wave-photonic active probes; on-wafer measurements; on-wafer network analyzer; packaged mm-wave-photonic active pro; scattering parameters; ultrafast optoelectronic techniques; Bandwidth; Coplanar waveguides; Integrated circuit measurements; Laboratories; Optical pulses; Packaging; Planar waveguides; Probes; Sampling methods; Scattering parameters;
Conference_Titel :
Microwave Photonics, 1999. MWP '99. International Topical Meeting on
Conference_Location :
Melbourne, Vic.
Print_ISBN :
0-7803-5558-X
DOI :
10.1109/MWP.1999.819660
