DocumentCode :
3515979
Title :
Application of multimode TRL technique for accurate balun characterization and estimation of its impact on measurement of differential devices
Author :
Issakov, Vadim ; Wojnowski, Maciej ; Sommer, Grit
Author_Institution :
Infineon Technol. AG, Neubiberg, Germany
fYear :
2011
fDate :
10-10 June 2011
Firstpage :
1
Lastpage :
6
Abstract :
Direct characterization of differential components requires multiport equipment, which is not always available. Thus, it is a common practice to attach balanced-unbalanced (balun) circuits to convert between single-ended and differential signals and perform the measurement using a lower cost two-port vector network analyzer (VNA) or a spectrum analyzer. However, removing the impact of baluns is a challenge. The Insertion Loss technique is commonly applied for two-port measurements of active differential devices to remove the impact of the baluns. In this work we apply the multimode TRL technique for accurate characterization of balun´s S-parameters. We apply the obtained characteristics to provide insight into the impact of balun´s and device under test (DUT) properties on the de-embedding accuracy when the Insertion Loss method is used to characterize active differential devices. The error estimation approach has been verified for a differential Low-Noise Amplifier (LNA) at 24 GHz realized in SiGe:C technology. S-parameters of the LNA have been measured directly using a four-port VNA and compared with those obtained from a two-port measurement implementing the Insertion Loss de-embedding technique.
Keywords :
S-parameters; baluns; error analysis; network analysers; production testing; spectral analysers; S-parameter; accurate balun characterization; active differential device measurement; balanced-unbalanced circuit; balun S-parameter; de-embedding accuracy; device under test; differential component; differential low noise amplifier; differential signal; error estimation approach; four-port VNA; frequency 24 GHz; insertion loss de-embedding technique; multimode TRL technique; multiport equipment; spectrum analyzer; two-port measurement; two-port vector network analyzer; Calibration; Gain; Impedance matching; Insertion loss; Loss measurement; Measurement uncertainty; Scattering parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2011 77th ARFTG
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-959-1
Electronic_ISBN :
978-1-61284-960-7
Type :
conf
DOI :
10.1109/ARFTG77.2011.6034574
Filename :
6034574
Link To Document :
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