Title :
Analyses of RF impedance analyzer and LCR meter readout noise
Author :
Liu, Xin Meng ; Huang, Hui ; Xu, Hui
Author_Institution :
Nat. Inst. of Metrol., Beijing, China
Abstract :
Readout noise of RF impedance analyzer and LCR meter are observed and analyzed with narrow bandwidth noise theory. The difference between theory analysis and actual measurement results is shown. The effect of impedance measurement format on noise is discussed at last.
Keywords :
electric impedance measurement; electric noise measurement; LCR meter readout noise; RF impedance analyzer; impedance measurement format; narrow bandwidth noise theory; Admittance; Admittance measurement; Equations; Impedance; Impedance measurement; Noise; Radio frequency;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2011 77th ARFTG
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-959-1
Electronic_ISBN :
978-1-61284-960-7
DOI :
10.1109/ARFTG77.2011.6034577
