Title :
Uncertainty in multiport S-parameters measurements
Author :
Ferrero, Andrea ; Garelli, Marco ; Grossman, Brett ; Choon, Susan ; Teppati, Valeria
Author_Institution :
Dept. of Electron., Politec. di Torino, Torino, Italy
Abstract :
Measurement uncertainty is an often overlook aspect of modern RF and signal integrity measurements. Currently, one- and two-port measurement systems have been studied quite in detail, but few investigations have focused on multiport network analyzers. This paper presents recent advances of multiport S-parameters uncertainty analysis applied to inter-laboratory comparisons and large scale test instruments, such multiport cable testers.
Keywords :
S-parameters; measurement uncertainty; network analysers; radiofrequency measurement; test equipment; two-port networks; RF measurement; interlaboratory comparison; large scale test instrument; multiport S-parameter measurement uncertainty analysis; multiport cable tester; multiport network analyzer; one-port measurement system; signal integrity measurement; two-port measurement system; Calibration; Connectors; Measurement uncertainty; Noise; Noise measurement; Scattering parameters; Uncertainty;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2011 77th ARFTG
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-959-1
Electronic_ISBN :
978-1-61284-960-7
DOI :
10.1109/ARFTG77.2011.6034578
