Uncertainty in multiport S-parameters measurements

Author

Ferrero, Andrea ; Garelli, Marco ; Grossman, Brett ; Choon, Susan ; Teppati, Valeria

Author_Institution

Dept. of Electron., Politec. di Torino, Torino, Italy

fYear

2011

fDate

10-10 June 2011

Firstpage

1

Lastpage

4

Abstract

Measurement uncertainty is an often overlook aspect of modern RF and signal integrity measurements. Currently, one- and two-port measurement systems have been studied quite in detail, but few investigations have focused on multiport network analyzers. This paper presents recent advances of multiport S-parameters uncertainty analysis applied to inter-laboratory comparisons and large scale test instruments, such multiport cable testers.

Keywords

S-parameters; measurement uncertainty; network analysers; radiofrequency measurement; test equipment; two-port networks; RF measurement; interlaboratory comparison; large scale test instrument; multiport S-parameter measurement uncertainty analysis; multiport cable tester; multiport network analyzer; one-port measurement system; signal integrity measurement; two-port measurement system; Calibration; Connectors; Measurement uncertainty; Noise; Noise measurement; Scattering parameters; Uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Measurement Conference (ARFTG), 2011 77th ARFTG

Conference_Location

Baltimore, MD

Print_ISBN

978-1-61284-959-1

Electronic_ISBN

978-1-61284-960-7

Type

conf

DOI

10.1109/ARFTG77.2011.6034578

Filename

6034578