• DocumentCode
    3516060
  • Title

    Thermal optimization of 3D microcontacts using DOE and CFD analysis

  • Author

    Kafadarova, Nadezhda ; Andonova, Anna ; Andreev, Svetozar ; Arnaudov, Radosvet ; Tzanova, Slavka

  • Author_Institution
    Tech. Coll./Tech. Univ. Sofia - Plovdiv branch, Plovdiv
  • fYear
    2008
  • fDate
    1-4 Sept. 2008
  • Firstpage
    535
  • Lastpage
    540
  • Abstract
    The present article describes an approach for optimization of thermal performance of 3D micro-components from pin-ring type implemented in IC package to PCB assembly and micro mechanical actuators by common use of DOE and CFD simulations. The goal of the considered approach is to define a real concurrent process for design of reliable microelectronic systems for specific applications. A model, containing all of the requisite design factors such as sizes, material and form was created using the commercially available CFD software, FLOTHERM. The results of simulation of test structures are verified by thermovision measurements by infrared camera P640 of FLIR. Advantages and disadvantages of different studied constructions of micro-contacts are analyzed in respect of better parameters of the process of heat transfer.
  • Keywords
    computational fluid dynamics; electronic engineering computing; heat transfer; integrated circuit packaging; microactuators; printed circuits; 3D micro-components; 3D microcontacts; CFD analysis; CFD software; FLOTHERM; IC package; PCB assembly; heat transfer; infrared camera; micro mechanical actuators; microelectronic systems; pin-ring type; thermal optimization; thermovision measurements; Actuators; Application software; Assembly; Cameras; Computational fluid dynamics; Integrated circuit packaging; Microelectronics; Process design; Testing; US Department of Energy; Computational Fluid Dynamics; Design Optimization; Design of Experiments; Infrared Thermography; Micro-contacts;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
  • Conference_Location
    Greenwich
  • Print_ISBN
    978-1-4244-2813-7
  • Electronic_ISBN
    978-1-4244-2814-4
  • Type

    conf

  • DOI
    10.1109/ESTC.2008.4684406
  • Filename
    4684406