DocumentCode :
3516224
Title :
Functional Test-Case Generation by a Control Transaction Graph for TLM Verification
Author :
Kakoee, Mohammad Reza ; Neishaburi, M.H. ; Mohammadi, Siamak
Author_Institution :
Azad Univ., Tehran, Iran
fYear :
2007
fDate :
29-31 Aug. 2007
Firstpage :
157
Lastpage :
164
Abstract :
Transaction level modeling allows exploring several SoC design architectures leading to better performance and easier verification of the final product. Test cases play an important role in determining the quality of a design. Inadequate test-cases may cause bugs to remain after verification. Although TLM expedites the verification of a hardware design, the problem of having high coverage test cases remains unsettled at this level of abstraction. In this paper, first, in order to generate test-cases for a TL model we present a Control-Transaction Graph (CTG) describing the behavior of a TL Model. A Control Graph is a control flow graph of a module in the design and Transactions represent the interactions such as synchronization between the modules. Second, we define dependent paths (DePaths) on the CTG as test-cases for a transaction level model. The generated DePaths can find some communication errors in simulation and detect unreachable statements concerning interactions. We also give coverage metrics for a TL model to measure the quality of the generated test-cases. Finally, we apply our method on the SystemC model of AMBA-AHB bus as a case study and generate test-cases based on the CTG of this model.
Keywords :
C language; automatic test pattern generation; circuit simulation; formal verification; integrated circuit design; integrated circuit modelling; integrated circuit testing; synchronisation; system buses; system-on-chip; AMBA-AHB bus; SoC design architectures; SystemC model; communication errors; control transaction graph; define dependent paths; functional test-case generation; quality of design evaluation; transaction level modeling verification; Communication system control; Computer architecture; Computer bugs; Costs; Electronic design automation and methodology; Flow graphs; Hardware; Software testing; System testing; System-level design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital System Design Architectures, Methods and Tools, 2007. DSD 2007. 10th Euromicro Conference on
Conference_Location :
Lubeck
Print_ISBN :
978-0-7695-2978-3
Type :
conf
DOI :
10.1109/DSD.2007.4341464
Filename :
4341464
Link To Document :
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